Semicontact AFM Mode for Fast Determining the Subsurface Structure of Filled Elastomers

Using atomic force microscopy in the semicontact AFM mode, we examined surface of filled elastomer obtained by rupture method. A feature material is that it consists a soft binder and hard nanofiller particles. Filler particles are usually hidden layer. In our work, have shown information on phase shift during scanning makes possible to look into subsurface layer obtain more about geometry filler their location nanocomposite. It make visible fragments immersed binder, which almost invisible relief. This does not require use special modes microscope for analysis. enough reliable fast method mode.